Test Point Selection Method for Analog Circuit Fault Diagnosis Based on Similarity Coefficient
Author:
Affiliation:
1. School of Instrumentation Science and Opto-Electronics Engineering, Beihang University, 37 Xueyuan Road, Beijing 100191, China
2. School of Physics and Electronic Information, Huaibei Normal University, 100 Dongshan Road, Huaibei 235000, China
Abstract
Funder
Natural Science Research Project of Universities in Anhui Province
Publisher
Hindawi Limited
Subject
General Engineering,General Mathematics
Link
http://downloads.hindawi.com/journals/mpe/2018/9714206.pdf
Reference13 articles.
1. Entropy-Based Optimum Test Points Selection for Analog Fault Dictionary Techniques
2. A New Optimal Test Node Selection Method for Analog Circuit
3. A New Test Point Selection Method for Analog Circuit
4. Computer aided feature selection for enhanced analogue system fault location
5. A dc approach for analog fault dictionary determination
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