A New Test Point Selection Method for Analog Circuit
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-015-5506-8.pdf
Reference25 articles.
1. Bandler JW, Salama AE (1981) Fault diagnosis of analog circuits. Proc IEEE 73:1279–1325
2. Bandler JW, Salama AE (1985) Fault diagnosis of analog circuits. Proc IEEE 73(8):1279–1325
3. Devarakond SK, Sen S, Bhattacharya S, Chatterjee A (2012) Concurrent device/specification cause-effect monitoring for yield diagnosis using alternate diagnostic signatures. IEEE Des Test Comput 29(1):48–58
4. Duhamal P, Rault JC (1979) Automatic tests generation techniques for analog circuits and systems: A review. IEEE Trans Circ Syst I CAS-26:411–440
5. Golonek T, Rutkowski J (2007) Genetic-algorithm-based method for optimal analog test points selection. IEEE Trans Circ Syst II Exp Brief 54(2):117–121
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