Computer aided feature selection for enhanced analogue system fault location-Reference-Cited by-同舟云学术

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Computer aided feature selection for enhanced analogue system fault location

Published:1978-01 Issue:4 Volume:10 Page:265-280
ISSN:0031-3203
Container-title:Pattern Recognition
language:en
Short-container-title:Pattern Recognition

Author:

Varghese K.C.,Hywel Williams J.,Towill D.R.

Publisher

Elsevier BV

Subject

Artificial Intelligence,Computer Vision and Pattern Recognition,Signal Processing,Software

Reference31 articles.

1. Contributions of dynamic testing to system diagnosability, maintainability, and availability;Towill,1976

2. Introduction to Mathematical Techniques in Pattern Recognition;Andrews,1972

3. Statistical considerations in element value solutions;Berkowitz;IRE Trans. Military Electr.,1962

4. Fault isolation computer methods;Garzia;NASA Contractor Report CR-1758,1971

5. Computer techniques for solving electric circuits for fault isolation;Berkowitz;IEEE Trans. ASCP.,1963

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1. An Efficient Double Deep Q Learning Network-Based Soft Faults Detection and Localization in Analog Circuits;Journal of Circuits, Systems and Computers;2024-06-10

2. Fault Testing and Diagnosis in Analog Circuits Using Fault Dictionary Techniques;Journal of Biomedical and Allied Research;2022-08-09

3. Test Point Selection Method for Analog Circuit Fault Diagnosis Based on Similarity Coefficient;Mathematical Problems in Engineering;2018

4. Method of Selecting the Fault Detection Point for the Onboard Power Controller of a Maglev Train;ICTE 2015;2015-09-21

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