A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic Algorithm
Author:
Funder
guangxi key laboratory of automatic detection technology and instrument foundation
national natural science foundation of china
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
https://link.springer.com/content/pdf/10.1007/s10836-021-05974-w.pdf
Reference24 articles.
1. Burdiek B (2001) Generation of optimum test stimuli for nonlinear analog circuits using nonlinear programming and time-domain sensitivities. Proceedings Design, Automation and Test in Europe Conference and Exhibition, p 603–608
2. Coyette A Esen, B, Dobbelaere W, Vanhooren R, Gielen G (2016) Automatic Test Signal Generation for Mixed-Signal Integrated Circuits using Circuit Partitioning and Interval Analysis. In: 2016 IEEE International Test Conference, p 1–10
3. Deb K (1999) Multi-objective Genetic Algorithms: Problem Difficulties and Construction of Test Problems. Evol Comput 7(3):205–230
4. Deb K, Agrawal RB (1994) Simulated Binary Crossover for Continuous Search Space. Complex Syst 9(3):115–148
5. Golonek T, Rutkowski J (2007) Genetic-algorithm-based method for optimal analog test points selection. IEEE Trans Circuits Syst II Express Briefs 54(2):117–121
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