Generation of optimum test stimuli for nonlinear analog circuits using nonlinear programming and time-domain sensitivities

Author:

Burdiek B.

Publisher

IEEE Comput. Soc

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic Algorithm;Journal of Electronic Testing;2021-11-19

2. Feature Based Coverage Analysis of AMS Circuits;2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI);2018-07

3. Analog circuits fault diagnosis using multi-valued Fisher's fuzzy decision tree (MFFDT);International Journal of Circuit Theory and Applications;2015-04-10

4. Oscillation-based testing method for detecting switch faults in High-Q SC biquad filters;Facta universitatis - series: Electronics and Energetics;2015

5. Application of asymmetrical periodic signals as test vectors for analog fault detection: a novel perspective of classical concepts;Turkish Journal of Electrical Engineering and Computer Sciences;2012-01-01

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