Author:
Xu Xiaoqing,Cline Brian,Yeric Greg,Yu Bei,Pan David Z.
Cited by
11 articles.
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1. Standard Cell Full Abutment Check Method;2022 IEEE 41st International Conference on Electronics and Nanotechnology (ELNANO);2022-10-10
2. Pin Accessibility Prediction and Optimization with Deep Learning-based Pin Pattern Recognition;Proceedings of the 56th Annual Design Automation Conference 2019;2019-06-02
3. Pin Access-Driven Design Rule Clean and DFM Optimized Routing of Standard Cells under Boolean Constraints;Proceedings of the 2019 International Symposium on Physical Design;2019-04-04
4. Pin Accessibility-Driven Detailed Placement Refinement;Proceedings of the 2017 ACM on International Symposium on Physical Design;2017-03-19
5. Toward Unidirectional Routing Closure in Advanced Technology Nodes;IPSJ Transactions on System LSI Design Methodology;2017