Standard Cell Full Abutment Check Method
Author:
Affiliation:
1. Synopsys Armenia Educational Department Yerevan,Yerevan,Armenia
2. New York University Shanghai,Shanghai,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9926968/9926751/09926993.pdf?arnumber=9926993
Reference10 articles.
1. Pin Accessibility Prediction and Optimization with Deep Learning-based Pin Pattern Recognition
2. An evolutionary approach for standard-cell library reduction
3. 14nm Educational Design Kit: Capabilities, Deployment and Future;sh;Proceedings of the 7th Small Systems Simulation Symposium 2018,2018
4. Standard cell pin access checking integration into test design verification;abazyan;Proceedings of NAS RA and NPUA (series of technical sciences),2020
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