STIFF

Author:

Chakraborty Shounak1,Soteriou Vassos2,Själander Magnus1

Affiliation:

1. Norwegian University of Science and Technology, Trondheim, Norway

2. Cyprus University of Technology, Limassol, Cyprus

Funder

Marie Curie Individual Fellowship (MSCA-IF), EU

Publisher

ACM

Reference43 articles.

1. W. Ahn S.H. Shin C. Jiang H. Jiang M.A. Wahab and M.A. Alam. 2018. Integrated modeling of Self-heating of confined geometry (FinFET NWFET and NSHFET) transistors and its implications for the reliability of sub-20nm modern integrated circuits. Microelectronics Reliability (Elsevier) (2018). W. Ahn S.H. Shin C. Jiang H. Jiang M.A. Wahab and M.A. Alam. 2018. Integrated modeling of Self-heating of confined geometry (FinFET NWFET and NSHFET) transistors and its implications for the reliability of sub-20nm modern integrated circuits. Microelectronics Reliability (Elsevier) (2018).

2. Mohammad Alian , Ahmed H. M. O. Abulila , Lokesh Jindal , Daehoon Kim , and Nam Sung Kim . 2017 . NCAP: Network-Driven, Packet Context-Aware Power Management for Client-Server Architecture. In HPCA. Mohammad Alian, Ahmed H. M. O. Abulila, Lokesh Jindal, Daehoon Kim, and Nam Sung Kim. 2017. NCAP: Network-Driven, Packet Context-Aware Power Management for Client-Server Architecture. In HPCA.

3. Hussam Amrouch Victor M. van Santen Om Prakash Hammam Kattan Sami Salamin Simon Thomann and Jörg Henkel. 2019. Reliability Challenges with Self-Heating and Aging in FinFET Technology. In IOLTS. Hussam Amrouch Victor M. van Santen Om Prakash Hammam Kattan Sami Salamin Simon Thomann and Jörg Henkel. 2019. Reliability Challenges with Self-Heating and Aging in FinFET Technology. In IOLTS.

4. A. Bansal , M. Meterelliyoz , S. Singh , Jung Hwan Choi , J. Murthy, and K. Roy. 2006 . Compact thermal models for estimation of temperature-dependent power/performance in FinFET technology. In ASPDAC. A. Bansal, M. Meterelliyoz, S. Singh, Jung Hwan Choi, J. Murthy, and K. Roy. 2006. Compact thermal models for estimation of temperature-dependent power/performance in FinFET technology. In ASPDAC.

5. Christian Bienia , Sanjeev Kumar , Jaswinder Pal Singh, and Kai Li . 2008 . The PARSEC Benchmark Suite: Characterization and Architectural Implications. In PACT. Christian Bienia, Sanjeev Kumar, Jaswinder Pal Singh, and Kai Li. 2008. The PARSEC Benchmark Suite: Characterization and Architectural Implications. In PACT.

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