High Performance Graph Convolutional Networks with Applications in Testability Analysis

Author:

Ma Yuzhe1,Ren Haoxing2,Khailany Brucek2,Sikka Harbinder2,Luo Lijuan2,Natarajan Karthikeyan2,Yu Bei1

Affiliation:

1. CUHK

2. NVIDIA

Publisher

ACM

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1. A High Performance PODEM Algorithm with the Improved Backtrace Process;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18

2. Test Point Selection for Multi-Cycle Logic BIST using Multivariate Temporal-Spatial GCNs;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18

3. Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability;IEEE Transactions on Circuits and Systems I: Regular Papers;2024-07

4. Survey of Machine Learning for Software-assisted Hardware Design Verification: Past, Present, and Prospect;ACM Transactions on Design Automation of Electronic Systems;2024-06-21

5. DETECTive: Machine Learning-driven Automatic Test Pattern Prediction for Faults in Digital Circuits;Proceedings of the Great Lakes Symposium on VLSI 2024;2024-06-12

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