DETECTive: Machine Learning-driven Automatic Test Pattern Prediction for Faults in Digital Circuits-Reference-Cited by-同舟云学术

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DETECTive: Machine Learning-driven Automatic Test Pattern Prediction for Faults in Digital Circuits

Published:2024-06-12 Issue: Volume:1 Page:32-37
ISSN:
Container-title:Proceedings of the Great Lakes Symposium on VLSI 2024
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Author:

Petrolo Vincenzo¹^ORCID,Medya Sourav²^ORCID,Graziano Mariagrazia³^ORCID,Pal Debjit²^ORCID

Affiliation:

1. University of Illinois Chicago, USA and Politecnico di Torino, Italy

2. University of Illinois Chicago, USA

3. Politecnico di Torino, Italy

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3649476.3658696

Reference20 articles.

1. Accessed: 2024/04/21 09:07:02. ABC. https://people.eecs.berkeley.edu/ alanmi/abc/.

2. Accessed: 2024/04/21 09:07:02. Atalanta. https://github.com/hsluoyz/Atalanta.

3. Accessed: 2024/04/21 09:07:02. Synopsys TestMAX ATPG. https://www.synopsys.com/implementation-and-signoff/test-automation/testmax-atpg.html.

4. Accessed: 2024/04/21 09:07:02. Yosys Open SYnthesis Suite. https://yosyshq.net/yosys/.

5. J. Bannino, J.-F. Santucci, and D. Floutier. 1996. Hybrid neural model for automatic test pattern generation. Int’l Conf. on Electronics, Circuits, and Systems (ICECS) 1 (1996), 259–262 vol.1.

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