1. Transparent scan: a new approach to test generation and test compaction for scan circuits that incorporates limited scan operations
2. Test Compaction Under Bounded Transparent-Scan
3. Test application time reduction for sequential circuits with scan
4. I. Pomeranz and S. M. Reddy . 1998. Static Test Compaction for Scan-Based Designs to Reduce Test Application Time . In Proc. IEEE Asian Test Symp. 198--203 . I. Pomeranz and S. M. Reddy. 1998. Static Test Compaction for Scan-Based Designs to Reduce Test Application Time. In Proc. IEEE Asian Test Symp. 198--203.
5. P. C. Maxwell , R. C. Aitken , K. R. Kollitz and A. C. Brown . 1996. IDDQ and AC Scan: The War Against Unmodelled Defects . In Proc. IEEE Intl. Test Conf. 250--258 . P. C. Maxwell, R. C. Aitken, K. R. Kollitz and A. C. Brown. 1996. IDDQ and AC Scan: The War Against Unmodelled Defects. In Proc. IEEE Intl. Test Conf. 250--258.