Test Compaction Under Bounded Transparent-Scan
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2 articles.
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1. Topping Off Test Sets Under Bounded Transparent Scan;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-01
2. Compaction of Compressed Bounded Transparent-Scan Test Sets;Proceedings of the Great Lakes Symposium on VLSI 2022;2022-06-06