Author:
Soo Young Lee ,Saluja K.K.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
54 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Test Compaction Using (k, 1)-Cycle Tests;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
2. Compact Set of Functional Broadside Tests with Fault Detection on Primary Outputs;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24
3. Topping Off Test Sets Under Bounded Transparent Scan;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-01
4. Compaction of Compressed Bounded Transparent-Scan Test Sets;Proceedings of the Great Lakes Symposium on VLSI 2022;2022-06-06
5. Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-02