Compact Set of Functional Broadside Tests with Fault Detection on Primary Outputs
Author:
Affiliation:
1. Purdue University,School of Electrical and Computer Engineering,West Lafayette,IN,U.S.A.,47907
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10139918/10139926/10140078.pdf?arnumber=10140078
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1. A Multicycle Test Set Based on a Two-Cycle Test Set With Constant Primary Input Vectors
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3. LFSR-Based Generation of Multicycle Tests;pomeranz;IEEE Trans on Computer-Aided Design,2017
4. Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation
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