Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns-Reference-Cited by-同舟云学术

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Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns

Published:2007 Issue: Volume: Page:
ISSN:
Container-title:2007 IEEE International Test Conference
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Author:

Bhargava Gaurav,Meehl Dale,Sage James

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4437545/4437546/04437648.pdf?arnumber=4437648

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