Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
25 articles.
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1. Test Compaction Using (k, 1)-Cycle Tests;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
2. Storage-Based Logic Built-In Self-Test With Cyclic Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-09
3. Test Data Compression for Transparent-Scan Sequences;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-04
4. Topping Off Test Sets Under Bounded Transparent Scan;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-01
5. Usable Circuits with Imperfect Scan Logic;2022 IEEE 31st Asian Test Symposium (ATS);2022-11