An Enhanced Analytical Electrical Masking Model for Multiple Event Transients-Reference-Cited by-同舟云学术

An Enhanced Analytical Electrical Masking Model for Multiple Event Transients

Published:2016-05-18 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 26th edition on Great Lakes Symposium on VLSI
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Author:

Watkins Adam¹,Tragoudas Spyros¹

Affiliation:

1. Southern Illinois University Carbondale, Carbondale, IL, USA

Funder

National Science Foundation

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/2902961.2903007

Reference10 articles.

1. Miskov-Zivanov N.; Marculescu D.; "MARS-C: modeling and reduction of soft errors in combinational circuits " Design Automation Conference 2006 43rd ACM/IEEE vol. no. pp.767--772 0-0 0 10.1145/1146909.1147104 Miskov-Zivanov N.; Marculescu D.; "MARS-C: modeling and reduction of soft errors in combinational circuits " Design Automation Conference 2006 43rd ACM/IEEE vol. no. pp.767--772 0-0 0 10.1145/1146909.1147104

2. Soft-Error-Rate-Analysis (SERA) Methodology

3. FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs

4. Harada R.; Mitsuyama Y.; Hashimoto M.; Onoye T. "Neutron induced single event multiple transients with voltage scaling and body biasing " in Reliability Physics Symposium (IRPS) 2011 IEEE International vol. no. pp.3C.4.1--3C.4.5 10--14 April 2011 Harada R.; Mitsuyama Y.; Hashimoto M.; Onoye T. "Neutron induced single event multiple transients with voltage scaling and body biasing " in Reliability Physics Symposium (IRPS) 2011 IEEE International vol. no. pp.3C.4.1--3C.4.5 10--14 April 2011

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