On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate Estimation in Deep Submicron Technologies-Reference-Cited by-同舟云学术

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On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate Estimation in Deep Submicron Technologies

Published:2021-10-06 Issue: Volume: Page:
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Container-title:2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
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Author:

Tsoumanis Pelopidas,Paliaroutis Georgios-Ioannis,Evmorfopoulos Nestor,Stamoulis George

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9568273/9568279/09568306.pdf?arnumber=9568306

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Accurate Soft Error Rate Evaluation Using Event-Driven Dynamic Timing Analysis;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

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