Improving Combinational Circuit Reliability Against Multiple Event Transients via a Partition and Restructuring Approach
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Link
http://xplorestaging.ieee.org/ielx7/43/9075140/08675458.pdf?arnumber=8675458
Cited by 15 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. ARA-RCIV: Identifying Reliability-Critical Input Vectors of Logic Circuits Based on the Association Rules Analysis Approach;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-08
2. A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits;IEEE Transactions on Computers;2024-01
3. Fast and Scalable Gate-Level Simulation in Massively Parallel Systems;2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD);2023-10-28
4. Addressing Single-Event-Multiple-Transient Faults in Asynchronous RH-Click Controllers;2023 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI);2023-08-28
5. ICP-RL: Identifying Critical Paths for Fault Diagnosis Using Reinforcement Learning;ACM Transactions on Design Automation of Electronic Systems;2023-07-21
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