Author:
Hamzaoglu Ilker,Patel Janak H.
Cited by
45 articles.
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1. Test Compaction Using (k, 1)-Cycle Tests;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22
2. Dynamic Test Compaction of a Compressed Test Set Shared Among Logic Blocks;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-01
3. Compact Set of Functional Broadside Tests with Fault Detection on Primary Outputs;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24
4. Sharing of Compressed Tests Among Logic Blocks;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-04
5. An algorithmic approach for minimizing test power in VLSI circuits;IOP Conference Series: Materials Science and Engineering;2021-02-01