Incident Angle Dependence in Polymer TOF-SIMS Depth Profiling with C60 Ion Beams-Reference-Cited by-同舟云学术

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Incident Angle Dependence in Polymer TOF-SIMS Depth Profiling with C60 Ion Beams

Published:2009 Issue: Volume:7 Page:878-881
ISSN:1348-0391
Container-title:e-Journal of Surface Science and Nanotechnology
language:en
Short-container-title:e-J. Surf. Sci. Nanotechnol.

Author:

Iida Shin-ichi¹,Miyayama Takuya¹,Sanada Noriaki¹,Suzuki Mineharu¹,Fisher Gregory L.²,Bryan Scott R.²

Affiliation:

1. ULVAC-PHI, Inc., Japan

2. Physical Electronics, Inc., USA

Publisher

Surface Science Society Japan

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology

Link

http://www.jstage.jst.go.jp/article/ejssnt/7/0/7_0_878/_pdf

Reference14 articles.

1. [1] J. C. Vickerman and I. S. Gilmore (eds.), Surface Analysis —The Principal Techniques— (Wiley, 2009).

2. Extremely low sputtering degradation of polytetrafluoroethylene by C60 ion beam applied in XPS analysis

3. [3] T. Miyayama, N. Sanada, S. Iida, J. S. Hammond, and M. Suzuki, Appl. Surf. Sci. 255, 951 (2008).

4. [4] H.-G. Cramer, T. Grehl, F. Kollmer, R. Moellers, E. Niehuis, and D. Rading, Appl. Surf. Sci. 255, 966 (2008).

5. [5] G. L. Fisher, M. Dickinson, S. R. Bryan, and J. Moulder, Appl. Surf. Sci. 255, 819 (2008).

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1. Cross-section Observation of Organic Materials utilizing Ar-GCIB by TOF-SIMS;Journal of Surface Analysis;2015

2. Comparison of fullerene and large argon clusters for the molecular depth profiling of amino acid multilayers;Analytical and Bioanalytical Chemistry;2013-11-21

3. Practical Applications of Argon Gas Cluster Ion Beam for X-ray Photoelectron Spectroscopy and Time-of-flight Secondary Ion Mass Spectrometry;Journal of the Vacuum Society of Japan;2013

4. Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study;Analytical Chemistry;2012-09-05

5. Soft-sputtering of insulin films in argon-cluster secondary ion mass spectrometry;Rapid Communications in Mass Spectrometry;2011-03-29

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