Soft-sputtering of insulin films in argon-cluster secondary ion mass spectrometry-Reference-Cited by-同舟云学术

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Soft-sputtering of insulin films in argon-cluster secondary ion mass spectrometry

Published:2011-03-29 Issue:8 Volume:25 Page:1070-1074
ISSN:0951-4198
Container-title:Rapid Communications in Mass Spectrometry
language:en
Short-container-title:Rapid Commun. Mass Spectrom.

Author:

Oshima Shohei¹,Kashihara Ippei¹,Moritani Kousuke¹,Inui Norio¹,Mochiji Kozo¹

Affiliation:

1. Department of Mechanical and System Engineering, Graduate School of Engineering; University of Hyogo; 2167 Shosha; Himeji; Hyogo; 671-2280; Japan

Publisher

Wiley

Subject

Organic Chemistry,Spectroscopy,Analytical Chemistry

Reference21 articles.

1. Detection, identification, and structural investigation of biologically important compounds by secondary ion mass spectrometry

2. Fast atom bombardment of solids as an ion source in mass spectrometry

3. Secondary ion mass spectrometry using cluster primary ion beams

4. Development of a C60+ ion gun for static SIMS and chemical imaging

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1. Reactive molecular dynamics simulations of lysozyme desorption under Ar cluster impact;Applied Surface Science;2023-09

2. Surface-sampling mass spectrometry to study proteins and protein complexes;Essays in Biochemistry;2023-03

3. Gas Cluster Ion Beams as a Versatile Soft-Landing Tool for the Controlled Construction of Thin (Bio)Films;ACS APPL BIO MATER;2022

4. Gas Cluster Ion Beams as a Versatile Soft-Landing Tool for the Controlled Construction of Thin (Bio)Films;ACS Applied Bio Materials;2022-07-08

5. Deposition of Intact and Active Proteins In Vacuo Using Large Argon Cluster Ion Beams;The Journal of Physical Chemistry Letters;2021-01-14

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