New approach to cathodoluminescence studies in application to InGaN/GaN laser diode degradation

Author:

PŁUSKA M.,CZERWINSKI A.,RATAJCZAK J.,KĄTCKI J.,MARONA L.,CZERNECKI R.,LESZCZYŃSKI M.,PERLIN P.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Reference15 articles.

1. Resistance and sheet resistance measurements using electron beam induced current;Czerwinski;Appl. Phys. Lett.,2006

2. Layer or strip resistance measurement by electron beam induced current technique in a scanning electron microscope;Czerwinski;Mater. Trans.,2007

3. Resistance impact of resistance on cathodoluminescence and its application for layer sheet-resistance measurements;Czerwinski;Appl. Phys. Lett.,2008

4. Dependence of cathodoluminescence on layer resistance applied for measurement of thin-layer sheet-resistance;Czerwinski;J. Microsc.,2009

5. Comparison of degradation mechanisms of blue-violet laser diodes grown on SiC and GaN substrates;Furitsch;Phys. Status Solidi A,2006

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