Impact of resistance on cathodoluminescence and its application for layer sheet-resistance measurements
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2966339
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3. Investigation of the recombination activity of misfit dislocations in Si/SiGe epilayers by cathodoluminescence imaging and the electron beam induced current technique
4. Impurity aggregation at individual dislocations in GaAs observed by means of a simultaneous electron beam induced current and cathodoluminescence technique
5. Influence of doping level on the cathodoluminescence of Se-doped GaSb crystals
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