Resistance and sheet resistance measurements using electron beam induced current
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2405886
Reference10 articles.
1. D. K. Schroder, Semiconductor Material and Device Characterization, 2nd ed. (Wiley-Interscience, New York, 1998), pp. 453–455.
2. Charge collection scanning electron microscopy
3. Evaluation of diffusion lengths and surface recombination velocities from electron beam induced current scans
4. Temperature dependent electron beam induced current experiments on chalcopyrite thin film solar cells
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