The relative importance of multiple inelastic scattering in the quantification of EELS-Reference-Cited by-同舟云学术

The relative importance of multiple inelastic scattering in the quantification of EELS

Published:1983-05 Issue:2 Volume:130 Page:177-186
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:

Author:

Bourdillon A. J.,Hall D. J.,Morrison C. J.,Stobbs W. M.

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1365-2818.1983.tb04216.x/fullpdf

Reference19 articles.

1. Crystallographic orientation effects in energy dispersive X-ray analysis;Bourdillon;Phil. Mag.,1981a

2. Comparison of orientation effects in electron energy loss and energy-dispersive X-ray spectroscopy;Bourdillon;Proc. Quant. Micr. with High Spatial Res., Manchester Met. Soc.,1981b

3. Bourdillon , A.J. Williams , B.G. 1982 Electron energy-loss spectroscopy used for localised Compton scattering Proc. th Ann. Meeting Elect. Micr. Soc. Am., Washington 506

4. Characteristic X-ray production in thin crystals;Cherns;Z. Naturf. (a),1973

5. Study of single-electron excitations by electron microscopy. I. Image contrast from delocalized excitations;Craven;Phil. Mag.,1978

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1. Light elements quantitative x-ray microanalysis of thin samples in STEM. Absorption correction using EELS data;Journal of Physics D: Applied Physics;2003-06-19

2. Quantitative analysis of electron-energy-loss spectra;Ultramicroscopy;1989-04

3. Preliminary investigations of a correlation between electron energy loss and morphometric analyses on ultrathin cryosections from normal and neoplastic gastric tissues;Virchows Archiv A Pathological Anatomy and Histopathology;1986

4. Elastic scattering in EELS-fundamental corrections to quantification;Ultramicroscopy;1985-01

5. The measurement of impact parameters by crystallographic orientation effects in electron scattering;Philosophical Magazine A;1984-12