Light elements quantitative x-ray microanalysis of thin samples in STEM. Absorption correction using EELS data-Reference-Cited by-同舟云学术

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Light elements quantitative x-ray microanalysis of thin samples in STEM. Absorption correction using EELS data

Published:2003-06-19 Issue:13 Volume:36 Page:1599-1604
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Banchet V,Michel J,Jallot E,Laurent-Maquin D,Balossier G

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/36/i=13/a=326/pdf

Reference24 articles.

1. Calibration Specimens for Determining Energy-Dispersive X-ray k-Factors of Boron, Nitrogen, Oxygen, and Fluorine

2. The quantitative analysis of thin specimens

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1. Light Element (C, N, O) Quantification by EDXS: Application to Meteorite Water Content and Organic Composition;Microscopy and Microanalysis;2024-08

2. Extending ζ-factor microanalysis to boron-rich ceramics: Quantification of bulk stoichiometry and grain boundary composition;Ultramicroscopy;2019-07

3. New pathways for improved quantification of energy-dispersive X-ray spectra of semiconductors with multiple X-ray lines from thin foils investigated in transmission electron microscopy;Journal of Microscopy;2015-11-02

4. Synthesis and characterisation of sol gel derived bioactive glass for biomedical applications;Materials Letters;2006-12

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