New pathways for improved quantification of energy-dispersive X-ray spectra of semiconductors with multiple X-ray lines from thin foils investigated in transmission electron microscopy-Reference-Cited by-同舟云学术

New pathways for improved quantification of energy-dispersive X-ray spectra of semiconductors with multiple X-ray lines from thin foils investigated in transmission electron microscopy

Published:2015-11-02 Issue:3 Volume:260 Page:427-441
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

PARRI M.C.¹,QIU Y.¹²,WALTHER T.¹

Affiliation:

1. Department of Electronic & Electrical Engineering; University of Sheffield; Mappin Street, Sheffield S1 3JD UK

2. now at: IMEC; Kapeldreef 75; B-3001 Leuven Belgium

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jmi.12345/fullpdf

Reference30 articles.

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4. Applicability of the differential X-ray absorption method to the determination of foil thickness and local composition in the analytical electron microscope;Horita;Philos. Mag. A,1989

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