The measurement of impact parameters by crystallographic orientation effects in electron scattering
Author:
Publisher
Informa UK Limited
Subject
Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials
Link
http://www.tandfonline.com/doi/pdf/10.1080/01418618408237541
Reference21 articles.
1. The relative importance of multiple inelastic scattering in the quantification of EELS
2. Crystallographic orientation effects in energy dispersive X-ray analysis
3. Electron impact excitation of positive ions
4. Electron impact excitation of the resonance lines of alkali-like positive ions
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