Validated Prediction of the Strength Size Effect in Polycrystalline Silicon Using the Three-Parameter Weibull Function-Reference-Cited by-同舟云学术

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Validated Prediction of the Strength Size Effect in Polycrystalline Silicon Using the Three-Parameter Weibull Function

Published:2014-09-13 Issue:12 Volume:97 Page:3982-3990
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:J. Am. Ceram. Soc.

Author:

Saleh Mohamed E.¹,Beuth Jack L.¹,de Boer Maarten P.¹

Affiliation:

1. Mechanical Engineering Department; Carnegie Mellon University; Pittsburgh Pennsylvania 15213

Funder

National Science Foundation

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/jace.13226/fullpdf

Reference43 articles.

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2. A Low-Noise Low-Offset Capacitive Sensing Amplifier for a 50-µg/v Hz Monolithic CMOS MEMS Accelerometer;Wu;Solid-State Circuits, IEEE J.,2004

3. Single-Chip Surface Micromachined Integrated Gyroscope with 50/h Allan Deviation;Geen;IEEE J. Solid-State Circuits,2002

4. Micromachined Optical Microphone Structures with Low Thermal-Mechanical Noise Levels;Hall;J. Acoust. Soc. Am.,2007

5. Fracture Toughness and Subcritical Crack Growth in Polycrystalline Silicon;Chasiotis;J. Appl. Mech.,2006

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