Current density at failure of twinned silver nanowires

Abstract

Abstract Silver nanowires have a wide range of potential applications in stretchable and transparent electronics due to their excellent electrical, mechanical, and optical properties. For a successful application in electronic devices, evaluating the electrical reliability of these nanowires is required. We have studied experimentally the behavior of current density at failure for penta-twinned silver nanowires with diameters between 53 and 173 nm, for 93 samples. The current densities at failure are widely scattered, have an average of 9.7 × 107 A cm−2, and a standard deviation of 2.96 × 107 A cm−2. Heat-transfer modeling is employed to explain the results, and Weibull statistics are used to quantify failure probabilities, thus offering guidelines for future designs based on these nanowires. The scatter observed in the measurements is attributed to surface-roughness variations among samples, which lead to local hot spots of high current density. These results quantify the Joule heating electrical reliability of silver nanowires and highlight the importance of heat transfer in increasing it.