Strain mapping accuracy improvement using super‐resolution techniques-Reference-Cited by-同舟云学术

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Strain mapping accuracy improvement using super‐resolution techniques

Published:2015-10-26 Issue:1 Volume:262 Page:50-58
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

BÁRCENA‐GONZÁLEZ G.¹,GUERRERO‐LEBRERO M.P.¹,GUERRERO E.¹,FERNÁNDEZ‐REYES D.²,GONZÁLEZ D.²,MAYORAL A.³,UTRILLA A.D.⁴,ULLOA J.M.⁴,GALINDO P.L.¹

Affiliation:

1. Department of Computer Science and EngineeringUniversity of Cádiz Cádiz Spain

2. Department of Material Science and Metallurgy Engineering and Inorganic ChemistryUniversity of Cádiz Cádiz Spain

3. Institute of Nanoscience of Aragon and Laboratory of Advanced MicroscopiesUniversity of Zaragoza Zaragoza Spain

4. Institute for Systems based on Optoelectronics and Microtechnology (ISOM)Universidad Politecnica de Madrid Madrid Spain

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/jmi.12341

Reference30 articles.

1. Optimized imaging using non-rigid registration

2. Imaging Intracellular Fluorescent Proteins at Nanometer Resolution

3. High-Quality Image Formation by Nonlocal Means Applied to High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy (HAADF–STEM)

4. Correcting scanning instabilities from images of periodic structures

5. Buades A. Coll B.&Morel J.(2005).A non‐local algorithm for image denoising. IEEE Computer Society Conference on Computer Vision and Pattern Recognition 2005. CVPR 2005 2 60–65.

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4. CDrift: An Algorithm to Correct Linear Drift From A Single High-Resolution STEM Image;Microscopy and Microanalysis;2020-07-24

5. Analysis by HR-STEM of the Strain Generation in InP after SiNx Deposition and ICP Etching;Journal of Electronic Materials;2020-07-15

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