High-Quality Image Formation by Nonlocal Means Applied to High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy (HAADF

High-Quality Image Formation by Nonlocal Means Applied to High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy (HAADF–STEM)

Published:2012 Issue: Volume: Page:127-145
ISSN:1571-5744
Container-title:Modeling Nanoscale Imaging in Electron Microscopy
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Author:

Binev Peter,Blanco-Silva Francisco,Blom Douglas,Dahmen Wolfgang,Lamby Philipp,Sharpley Robert,Vogt Thomas

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4614-2191-7_5.pdf

Reference16 articles.

1. Benjamin Berkels (2010) Joint methods in imaging based on diffuse image representations. Dissertation, University of Bonn

2. Binev P, Blanco-Silva F, Blom D, Dahmen W, Sharpley R, Vogt T (2009) Superresolution image reconstruction by nonlocal-means applied to HAADF–STEM. IMI Preprint Series 2009:06, University of South Carolina

3. Buades A, Coll B, Morel JM (2005) A review of image denoising algorithms with a new one. Multisc Model Simul 4:490–530

4. Buban JP, Ramasse Q, Gipson B, Browning ND, Stahlberg H (2010) High-resolution low-dose scanning transmission electron microscopy. J Electron Microsc (Tokyo) 59(2):103–112

5. Crewe AV, Wall J, Langmore L (1970) Visibility of single atoms. Nature 168:1338–1340

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