CDrift: An Algorithm to Correct Linear Drift From A Single High-Resolution STEM Image
Author:
Abstract
Publisher
Cambridge University Press (CUP)
Subject
Instrumentation
Reference22 articles.
1. High-resolution Z-contrast imaging of crystals
2. Retrieval process of high-resolution HAADF-STEM images
3. Local crystal structure analysis with 10-pm accuracy using scanning transmission electron microscopy
4. Precision controlled atomic resolution scanning transmission electron microscopy using spiral scan pathways
5. Revolving scanning transmission electron microscopy: Correcting sample drift distortion without prior knowledge
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