Evaluation of different rectangular scan strategies for STEM imaging

Author:

Velazco A.,Nord M.,Béché A.,Verbeeck J.

Funder

Flanders Research Fund

Horizon 2020

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference24 articles.

1. Aberration-corrected scanning transmission electron microscopy: from atomic imaging and analysis to solving energy problems;Pennycook;Philos. Trans. R. Soc. A Math. Phys. Eng. Sci.,2009

2. Sub-ångstrom resolution using aberration corrected electron optics;Batson;Nature,2002

3. Instrumental factors in high-resolution FEG STEM;von Harrach;Ultramicroscopy,1995

4. Room design for high-performance electron microscopy;Muller;Ultramicroscopy,2006

5. Optimizing the environment for sub-0.2 nm scanning transmission electron microscopy;Muller;J. Electron Microsc.,2001

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