Multiple parametric nanoscale measurements with high sensitivity based on through‐focus scanning optical microscopy
Author:
Affiliation:
1. School of Instrumentation and Optoelectronic Engineering Beihang University Beijing China
2. Chinese Academy of Sciences Institute of Microelectronics of CAS Beijing China
Funder
National Natural Science Foundation of China
Publisher
Wiley
Subject
Histology,Pathology and Forensic Medicine
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1111/jmi.12792
Reference35 articles.
1. Patterned defect and CD metrology by TSOM beyond the 22-nm node
2. Through-focus scanning-optical-microscope imaging method for nanoscale dimensional analysis
3. Linewidth measurement technique using through-focus optical images
4. TSOM method for semiconductor metrology
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Machine Learning Enhanced Optical Microscopy for the Rapid Morphology Characterization of Silver Nanoparticles;ACS Applied Materials & Interfaces;2023-04-03
2. 先进节点图案化晶圆缺陷检测技术;Laser & Optoelectronics Progress;2023
3. 3D microscopy in industrial measurements;Journal of Microscopy;2022-12-07
4. Optical wafer defect inspection at the 10 nm technology node and beyond;International Journal of Extreme Manufacturing;2022-04-21
5. Statistical character analysis for through-focus scanning optical microscopy in double floating variables measurement applications;Optics and Lasers in Engineering;2021-06
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3