Limitations to the determination of the optical properties of a thin film by combined ellipsometric and surface plasmon resonance measurements
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The Optical Society
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4. Simultaneous Thickness and Refractive Index Determination of Monolayers Deposited on an Aqueous Subphase by Null Ellipsometry;Langmuir;2001-10-23
5. Determining the relative permittivity and thickness of a lossless dielectric overlayer on a metal film using optically excited surface plasmon polaritons;Journal of Physics D: Applied Physics;1996-04-14
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