Determining the relative permittivity and thickness of a lossless dielectric overlayer on a metal film using optically excited surface plasmon polaritons-Reference-Cited by-同舟云学术

Determining the relative permittivity and thickness of a lossless dielectric overlayer on a metal film using optically excited surface plasmon polaritons

Published:1996-04-14 Issue:4 Volume:29 Page:1080-1087
ISSN:0022-3727
Container-title:Journal of Physics D: Applied Physics
language:
Short-container-title:J. Phys. D: Appl. Phys.

Author:

Phelps J M,Taylor D M

Publisher

IOP Publishing

Subject

Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://stacks.iop.org/0022-3727/29/i=4/a=023/pdf

Reference33 articles.

1. Surface electromagnetic waves ellipsometry

2. Thin Langmuir-Blodgett films studied using surface plasmon-polaritons

3. Monolayer and multilayer film characterisation using surface plasmon resonance

4. Resolving the apparent ambiguity in determining the relative permittivity and thickness of a metal film using optical excitation of surface plasmon-polaritons

5. Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance

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