Determining the relative permittivity and thickness of a lossless dielectric overlayer on a metal film using optically excited surface plasmon polaritons
Author:
Publisher
IOP Publishing
Subject
Surfaces, Coatings and Films,Acoustics and Ultrasonics,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://stacks.iop.org/0022-3727/29/i=4/a=023/pdf
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1. Surface electromagnetic waves ellipsometry
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5. Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance
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