Resolving the apparent ambiguity in determining the relative permittivity and thickness of a metal film using optical excitation of surface plasmon-polaritons-Reference-Cited by-同舟云学术

Resolving the apparent ambiguity in determining the relative permittivity and thickness of a metal film using optical excitation of surface plasmon-polaritons

Published:1990-11 Issue:6 Volume:79 Page:427-430
ISSN:0030-4018
Container-title:Optics Communications
language:en
Short-container-title:Optics Communications

Author:

Cowen S.,Sambles J.R.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Physical and Theoretical Chemistry,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. Surface plasmons on smooth and rough surfaces and gratings;Raether,1988

2. Use of surface plasma waves for determination of the thickness and optical constants of thin metallic films

3. Use of exchanging media in ATR configurations for determination of thickness and optical constants of thin metallic films

4. Notizen: Radiative Decay of Non Radiative Surface Plasmons Excited by Light

5. Reexamination of the surface-plasma-wave technique for determining the dielectric constant and thickness of metal films

Cited by 22 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Thickness determination in anisotropic media with plasmon waveguide resonance imaging;Optics Express;2019-01-30

2. Plasmonics for the Characterization of Metal Organic Films and Nanoparticles;Metal Nanostructures for Photonics;2019

3. Accurate and simultaneous measurement of thickness and refractive index of thermally evaporated thin organic films by surface plasmon resonance spectroscopy;Optics Express;2014-07-29

4. The determination of the thickness and the optical dispersion property of gold film using spectroscopy of a surface plasmon in the frequency domain;Chinese Physics B;2013-02

5. Influence of the surface roughness on the properties of Au films measured by surface plasmon resonance and X-ray reflectometry;Thin Solid Films;2011-01