Reexamination of the surface-plasma-wave technique for determining the dielectric constant and thickness of metal films
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics,Statistical and Nonlinear Physics
Reference8 articles.
1. Use of surface plasma waves for determination of the thickness and optical constants of thin metallic films
2. Use of exchanging media in ATR configurations for determination of thickness and optical constants of thin metallic films
3. Die Bestimmung optischer Konstanten von Metallen durch Anregung von Oberflächenplasmaschwingungen
4. Excitation of nonradiative surface plasma waves in silver by the method of frustrated total reflection
5. Extreme attenuation of total internal reflection used for determination of optical properties of metals
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