Simultaneous Thickness and Refractive Index Determination of Monolayers Deposited on an Aqueous Subphase by Null Ellipsometry-Reference-Cited by-同舟云学术

Simultaneous Thickness and Refractive Index Determination of Monolayers Deposited on an Aqueous Subphase by Null Ellipsometry

Published:2001-10-23 Issue:24 Volume:17 Page:7529-7534
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Ducharme Daniel¹,Tessier Alain¹,Russev Stoyan C.¹

Affiliation:

1. Département de Chimie-Biologie, GREIB, Université du Québec à Trois-Rivières, Trois-Rivières, Quebec G9A 5H7, Canada, and Department of Solid State Physics, Faculty of Physics, Sofia University, Sofia, Bulgaria, 1164

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la001528k

Reference16 articles.

1. Ellipsometric study of organic monolayers. Part 1.—Condensed monolayers

2. Ellipsometry in the sub-monolayer region

3. Spectral simulation of uniaxially oriented monolayers in the infrared

4. Ellipsometric study of the physical states of phosphatidylcholines at the air-water interface

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