Low-index, smooth Al_2O_3 films by aqueous solution process-Reference-Cited by-同舟云学术

Low-index, smooth Al_2O_3 films by aqueous solution process

Published:2016-12-22 Issue:1 Volume:7 Page:273
ISSN:2159-3930
Container-title:Optical Materials Express
language:en
Short-container-title:Opt. Mater. Express

Author:

Perkins Cory K.,Mansergh Ryan H.,Ramos Juan C.,Nanayakkara Charith E.,Park Deok-Hie,Goberna-Ferrón Sara,Fullmer Lauren B.,Arens Joshua T.,Gutierrez-Higgins Maceo T.,Jones Yolanda R.,Lopez Jonathon I.,Rowe Thomas M.,Whitehurst Danielle M.,Nyman May,Chabal Yves J.,Keszler Douglas A.

Funder

National Science Foundation (NSF)

Publisher

The Optical Society

Subject

Electronic, Optical and Magnetic Materials

Reference25 articles.

1. Optical thin-film materials with low refractive index for broadband elimination of Fresnel reflection

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3. Atomic Layer Deposition of MgF2 Thin Films Using TaF5 as a Novel Fluorine Source

4. MgF2 antireflective coatings by sol–gel processing: film preparation and thermal densification

5. Mechanical, optical and structural properties of TiO 2 and MgF 2 thin films deposited by plasma ion assisted deposition

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