Extraction of recombination coefficients and internal quantum efficiency of GaN-based light emitting diodes considering effective volume of active region
Author:
Funder
Samsung
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference20 articles.
1. Recent Progress in GaN-Based Light-Emitting Diodes
2. Polarization-matched GaInN∕AlGaInN multi-quantum-well light-emitting diodes with reduced efficiency droop
3. On the efficiency droop in InGaN multiple quantum well blue light emitting diodes and its reduction with p-doped quantum well barriers
4. Effect of electron blocking layer on efficiency droop in InGaN/GaN multiple quantum well light-emitting diodes
5. Density-activated defect recombination as a possible explanation for the efficiency droop in GaN-based diodes
Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Enhanced deep ultraviolet light emission from AlGaN based nanowire with bowtie antenna array;Micro and Nanostructures;2024-06
2. III-nitride nanowires for emissive display technology;Journal of Information Display;2023-11-21
3. Enhanced light output from deep ultraviolet light-emitting diodes enabled by high-order modes on a photonic crystal surface;Optics Letters;2023-01-02
4. Efficiency and radiative recombination rate enhancement in GaN/AlGaN multi-quantum well-based electron blocking layer free UV-LED for improved luminescence;Facta universitatis - series: Electronics and Energetics;2023
5. Carrier Transport and Radiative Recombination Rate Enhancement in GaN/AlGaN Multiple Quantum Well UV-LED Using Band Engineering for Light Technology;Lecture Notes in Electrical Engineering;2022-09-12
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3