In situ high temperature microwave microscope for nondestructive detection of surface and sub-surface defects
Author:
Funder
China Academy of Engineering Physics (CAEP)
National Natural Science Foundation of China (NSFC)
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
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1. Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology
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