The near-field microwave technique for deep profiling of free carrier concentration in semiconductors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3580167
Reference29 articles.
1. Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7−x films
2. 0.4 μm spatial resolution with 1 GHz (λ=30 cm) evanescent microwave probe
3. Imaging of microwave permittivity, tunability, and damage recovery in (Ba, Sr)TiO3 thin films
4. High-spatial resolution resistivity mapping of large-area YBCO films by a near-field millimeter-wave microscope
5. High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope
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