Optical method for simultaneous thickness measurements of two layers with a significant thickness difference
Author:
Funder
Korea Research Institute of Standards and Science
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference72 articles.
1. Thin-film coating; historical evolution, conventional deposition technologies, stress-state micro/nano-level measurement/models and prospects projection: a critical review
2. Special Issue: Current Research in Thin Film Deposition: Applications, Theory, Processing, and Characterisation
3. Non-uniform, axisymmetric misfit strain: in thin films bonded on plate substrates/substrate systems: the relation between non-uniform film stresses and system curvatures
4. On the Stoney Formula for a Thin Film/Substrate System With Nonuniform Substrate Thickness
Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A review on optical characterization of refractive index in photonic related devices and applications;Journal of Physics D: Applied Physics;2024-09-10
2. A Review of Thin-film Thickness Measurements using Optical Methods;International Journal of Precision Engineering and Manufacturing;2024-06-22
3. Thin film thickness analysis based on a deep learning algorithm using data augmentation;Metrology, Inspection, and Process Control XXXVIII;2024-04-10
4. Accuracy-improved ultrasonic phase algorithm for measuring lubricant film thickness;International Journal of Mechanical Sciences;2024-04
5. Large-Area Thickness Measurement of Transparent Films Based on a Multichannel Spectral Interference Sensor;Applied Sciences;2024-03-27
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3