Non-uniform, axisymmetric misfit strain: in thin films bonded on plate substrates/substrate systems: the relation between non-uniform film stresses and system curvatures-Reference-Cited by-同舟云学术

Non-uniform, axisymmetric misfit strain: in thin films bonded on plate substrates/substrate systems: the relation between non-uniform film stresses and system curvatures

Published:2005-08 Issue:4 Volume:21 Page:362-370
ISSN:0567-7718
Container-title:Acta Mechanica Sinica
language:en
Short-container-title:ACTA MECH SINICA

Author:

Huang Yonggang,Ngo D.,Rosakis A. J.

Publisher

Springer Science and Business Media LLC

Subject

Mechanical Engineering,Computational Mechanics

Link

http://link.springer.com/content/pdf/10.1007/s10409-005-0051-9.pdf

Reference14 articles.

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4. Wikstrom, A., Gudmundson, P., Suresh, S.: Thermoelastic analysis of periodic thin lines deposited on a substrate. J Mech Phys Solids 47, 1113–1130 (1999a)

5. Shen, Y.L., Suresh, S., Blech, I.A.: Stresses, curvatures, and shape changes arising from patterned lines on silicon wafers. J Appl Phys 80, 1388–1398 (1996)

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