Current-induced degradation and lifetime prediction of 310 nm ultraviolet light-emitting diodes-Reference-Cited by-同舟云学术

Current-induced degradation and lifetime prediction of 310 nm ultraviolet light-emitting diodes

Published:2019-06-24 Issue:7 Volume:7 Page:B36
ISSN:2327-9125
Container-title:Photonics Research
language:en
Short-container-title:Photon. Res.

Author:

Ruschel Jan^ORCID,Glaab Johannes^ORCID,Beidoun Batoul,Ploch Neysha Lobo,Rass Jens,Kolbe Tim,Knauer Arne,Weyers Markus^ORCID,Einfeldt Sven,Kneissl Michael^ORCID

Funder

Bundesministerium für Bildung und Forschung (BMBF)

Deutsche Forschungsgemeinschaft (DFG)

Advanced UV for Life

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference31 articles.

1. Curing of composite components by ultraviolet radiation: A review

2. Mechanisms of Ultraviolet (UV) B and UVA Phototherapy

3. UV-B Induced Secondary Plant Metabolites

4. Degradation of (InAlGa)N-based UV-B light emitting diodes stressed by current and temperature

5. Current-induced degradation of high performance deep ultraviolet light emitting diodes

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