XPS analysis of metallic trace contaminations on fused silica surfaces induced by classical optics manufacturing
Author:
Publisher
The Optical Society
Subject
Electronic, Optical and Magnetic Materials
Reference35 articles.
1. Characteristics of hydrolyzed layer and contamination on fused silica induced during polishing
2. Relationship between surface μ‐roughness and interface slurry particle spatial distribution during glass polishing
3. Polishing-induced contamination of fused silica optics and laser induced damage density at 351 nm
4. Chemistry and Formation of the Beilby Layer During Polishing of Fused Silica Glass
5. Fused silica contamination layer removal using magnetic field‐assisted finishing
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1. Dependency of the type of oxygen bonds on the roughness of classically manufactured fused silica surfaces;Applied Surface Science;2024-01
2. LIBS Analysis of Optical Surfaces and Thin Films;Laser Induced Breakdown Spectroscopy (LIBS);2023-03-17
3. Depth-resolved XPS analysis of classically manufactured glass surfaces: suggesting the impact of polishing-induced modifications on the performance of optical systems;OPT MATER EXPRESS;2022
4. Depth-resolved XPS analysis of classically manufactured glass surfaces: suggesting the impact of polishing-induced modifications on the performance of optical systems;Optical Materials Express;2022-08-22
5. Impact of different types of water as lubricants on roughness and contamination of bound abrasive ground heavy flint glass surfaces;Ninth European Seminar on Precision Optics Manufacturing;2022-07-15
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