Author:
Petersson Sture,Norde Herman,Possnert G.,Orre B.
Cited by
21 articles.
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1. Characterization of high-k dielectrics using MeV elastic scattering of He ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-03
2. Photoacoustic spectroscopy analysis of silicon crystals;Journal of Luminescence;2012-02
3. Mass and energy dispersive recoil spectrometry of Si Ge1− grown by electron beam evaporation;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-03
4. Peculiarities of the 16O(α, α)16O 3.045 Me V resonance scattering and its application to investigation of oxygen in silicon;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-11
5. Oxygen measurements by elastic backscattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-03